Defect characterization of Cd0.9Zn0.1Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements

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dc.contributor.author Pak, Rahmi O.
dc.contributor.author Nguyen, Khai V.
dc.contributor.author Oner, Cihan
dc.contributor.author Mohammad, A. Mannan
dc.contributor.author Mandal, Krishna C.
dc.date.accessioned 2023-12-21T06:46:23Z
dc.date.available 2023-12-21T06:46:23Z
dc.date.issued 2015
dc.identifier.citation Pak, R. O., Nguyen, K. V., Oner, C., Mannan, M. A., Mandal, K. C. (2015, August). Defect characterization of Cd0.9Zn0.1Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements. Optical Engineering + Applications 2015 – Part of SPIE Optics + Photonics, 95931J-1-8, San Diego, Ca, USA. tr_TR
dc.identifier.uri http://hdl.handle.net/20.500.11787/8353
dc.description.abstract Semi-insulating Cd0.9Zn0.1Te nuclear detector grade crystals were grown by a low temperature solution method from in-house zone refined (~7N) precursor materials. The processed crystals from the grown ingot were thoroughly characterized by using a non-destructive electron beam induced current (EBIC) contrast imaging method. The EBIC results were correlated with the infrared (IR) transmittance mapping, which confirms the variation of contrasts in EBIC is due to non-uniform distribution of tellurium inclusions in the grown CZT crystal. Electrical characteristics of defect regions in the fabricated detectors were further investigated by I-V measurements, and thermally stimulated current (TSC) measurements. Finally, to demonstrate the high quality of the grown CZT crystals, pulse height spectra (PHS) measurements were carried out using gamma radiation sources of 241Am (59.6 keV) and 137Cs (662 keV). tr_TR
dc.language.iso eng tr_TR
dc.publisher SPIE tr_TR
dc.relation.isversionof 10.1117/12.2196590 tr_TR
dc.rights info:eu-repo/semantics/openAccess tr_TR
dc.subject CZT tr_TR
dc.subject Defects tr_TR
dc.subject EBIC tr_TR
dc.subject TSC tr_TR
dc.title Defect characterization of Cd0.9Zn0.1Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements tr_TR
dc.type conferenceObject tr_TR
dc.relation.journal Proceedings Volume 9593, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII tr_TR
dc.contributor.department Elektrik-Elektronik Mühendisliği Bölümü tr_TR
dc.contributor.authorID 298671 tr_TR
dc.contributor.authorID 0000-0003-4967-9598 tr_TR


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